| 1997 |
|---|
| 5 | EE | Sankaran M. Menon,
Yashwant K. Malaiya,
Anura P. Jayasumana:
Input Pattern Classification for Detection of Stuck-ON and Bridging Faults Using I/sub DDQ/ Testing in BiCMOS and CMOS Circuits.
VLSI Design 1997: 545-546 |
| 1996 |
|---|
| 4 | EE | Sankaran M. Menon,
Anura P. Jayasumana,
Yashwant K. Malaiya:
Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS Circuits.
Great Lakes Symposium on VLSI 1996: 214-219 |
| 1995 |
|---|
| 3 | | Anura P. Jayasumana,
Yashwant K. Malaiya,
Sankaran M. Menon:
A Novel High-Speed BiCMOS Domino Logic Family.
ISCAS 1995: 21-24 |
| 1994 |
|---|
| 2 | | Sankaran M. Menon,
Yashwant K. Malaiya,
Anura P. Jayasumana,
Carol Q. Tong:
The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance.
VLSI Design 1994: 187-190 |
| 1993 |
|---|
| 1 | | Sankaran M. Menon,
Anura P. Jayasumana,
Yashwant K. Malaiya:
Test Generation for BiCMOS Circuits.
ISCAS 1993: 1987-1990 |
