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Marc M. Heyns

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2005
3EEG. S. Lujan, W. Magnus, L.-Å. Ragnarsson, S. Kubicek, Stefan De Gendt, Marc M. Heyns, K. De Meyer: Modelling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance. Microelectronics Reliability 45(5-6): 794-797 (2005)
2001
2EEC. Zhao, G. Roebben, H. Bender, E. Young, S. Haukka, M. Houssa, M. Naili, Stefan De Gendt, Marc M. Heyns, O. Van Der Biest: In situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction. Microelectronics Reliability 41(7): 995-998 (2001)
1999
1EEMarc M. Heyns, Twan Bearda, Ingrid Cornelissen, Stefan De Gendt, Robin Degraeve, Guido Groeseneken, Conny Kenens, D. Martin Knotter, Lee M. Loewenstein, Paul W. Mertens, Sofie Mertens, Marc Meuris, Tanya Nigam, Marc Schaekers, Ivo Teerlinck, Wilfried Vandervorst, Rita Vos, Klaus Wolke: Cost-effective cleaning and high-quality thin gate oxides. IBM Journal of Research and Development 43(3): 339-350 (1999)

Coauthor Index

1Twan Bearda [1]
2H. Bender [2]
3O. Van Der Biest [2]
4Ingrid Cornelissen [1]
5Robin Degraeve [1]
6Stefan De Gendt [1] [2] [3]
7Guido Groeseneken [1]
8S. Haukka [2]
9M. Houssa [2]
10Conny Kenens [1]
11D. Martin Knotter [1]
12S. Kubicek [3]
13Lee M. Loewenstein [1]
14G. S. Lujan [3]
15W. Magnus [3]
16Paul W. Mertens [1]
17Sofie Mertens [1]
18Marc Meuris [1]
19K. De Meyer [3]
20M. Naili [2]
21Tanya Nigam [1]
22L.-Å. Ragnarsson [3]
23G. Roebben [2]
24Marc Schaekers [1]
25Ivo Teerlinck [1]
26Wilfried Vandervorst [1]
27Rita Vos [1]
28Klaus Wolke [1]
29E. Young [2]
30C. Zhao [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)