M. Houssa

2005
2	EE	M. Houssa: Modelling negative bias temperature instabilities in advanced p-MOSFETs. Microelectronics Reliability 45(1): 3-12 (2005)
2001
1	EE	C. Zhao, G. Roebben, H. Bender, E. Young, S. Haukka, M. Houssa, M. Naili, Stefan De Gendt, Marc M. Heyns, O. Van Der Biest: In situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction. Microelectronics Reliability 41(7): 995-998 (2001)

Coauthor Index

1	H. Bender	[1]
2	O. Van Der Biest	[1]
3	Stefan De Gendt	[1]
4	S. Haukka	[1]
5	Marc M. Heyns	[1]
6	M. Naili	[1]
7	G. Roebben	[1]
8	E. Young	[1]
9	C. Zhao	[1]