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| 2005 | ||
|---|---|---|
| 1 | EE | G. S. Lujan, W. Magnus, L.-Å. Ragnarsson, S. Kubicek, Stefan De Gendt, Marc M. Heyns, K. De Meyer: Modelling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance. Microelectronics Reliability 45(5-6): 794-797 (2005) |
| 1 | Stefan De Gendt | [1] |
| 2 | Marc M. Heyns | [1] |
| 3 | S. Kubicek | [1] |
| 4 | W. Magnus | [1] |
| 5 | K. De Meyer | [1] |
| 6 | L.-Å. Ragnarsson | [1] |