Sofie Mertens

2001
2	EE	M. Da Rold, E. Simoen, Sofie Mertens, Marc Schaekers, G. Badenes, Stefaan Decoutere: Impact of gate oxide nitridation process on 1/f noise in 0.18 mum CMOS. Microelectronics Reliability 41(12): 1933-1938 (2001)
1999
1	EE	Marc M. Heyns, Twan Bearda, Ingrid Cornelissen, Stefan De Gendt, Robin Degraeve, Guido Groeseneken, Conny Kenens, D. Martin Knotter, Lee M. Loewenstein, Paul W. Mertens, Sofie Mertens, Marc Meuris, Tanya Nigam, Marc Schaekers, Ivo Teerlinck, Wilfried Vandervorst, Rita Vos, Klaus Wolke: Cost-effective cleaning and high-quality thin gate oxides. IBM Journal of Research and Development 43(3): 339-350 (1999)

Coauthor Index

1	G. Badenes	[2]
2	Twan Bearda	[1]
3	Ingrid Cornelissen	[1]
4	Stefaan Decoutere	[2]
5	Robin Degraeve	[1]
6	Stefan De Gendt	[1]
7	Guido Groeseneken	[1]
8	Marc M. Heyns	[1]
9	Conny Kenens	[1]
10	D. Martin Knotter	[1]
11	Lee M. Loewenstein	[1]
12	Paul W. Mertens	[1]
13	Marc Meuris	[1]
14	Tanya Nigam	[1]
15	M. Da Rold	[2]
16	Marc Schaekers	[1] [2]
17	E. Simoen	[2]
18	Ivo Teerlinck	[1]
19	Wilfried Vandervorst	[1]
20	Rita Vos	[1]
21	Klaus Wolke	[1]