L.-Å. Ragnarsson

2005
3	EE	T. Schram, L.-Å. Ragnarsson, G. Lujan, W. Deweerd, J. Chen, W. Tsai, K. Henson, R. J. P. Lander, J. C. Hooker, J. Vertommen: Performance improvement of self-aligned HfO2/TaN and SiON/TaN nMOS transistors. Microelectronics Reliability 45(5-6): 779-782 (2005)
2	EE	W. Deweerd, V. Kaushik, J. Chen, Y. Shimamoto, T. Schram, L.-Å. Ragnarsson, A. Delabie, L. Pantisano, B. Eyckens, J. W. Maes: Potential remedies for the VT/Vfb-shift problem of Hf/polysilicon-based gate stacks: a solution-based survey. Microelectronics Reliability 45(5-6): 786-789 (2005)
1	EE	G. S. Lujan, W. Magnus, L.-Å. Ragnarsson, S. Kubicek, Stefan De Gendt, Marc M. Heyns, K. De Meyer: Modelling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance. Microelectronics Reliability 45(5-6): 794-797 (2005)

Coauthor Index

1	J. Chen	[2] [3]
2	A. Delabie	[2]
3	W. Deweerd	[2] [3]
4	B. Eyckens	[2]
5	Stefan De Gendt	[1]
6	K. Henson	[3]
7	Marc M. Heyns	[1]
8	J. C. Hooker	[3]
9	V. Kaushik	[2]
10	S. Kubicek	[1]
11	R. J. P. Lander	[3]
12	G. Lujan	[3]
13	G. S. Lujan	[1]
14	J. W. Maes	[2]
15	W. Magnus	[1]
16	K. De Meyer	[1]
17	L. Pantisano	[2]
18	T. Schram	[2] [3]
19	Y. Shimamoto	[2]
20	W. Tsai	[3]
21	J. Vertommen	[3]

Colors in the list of coauthors