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S. Kubicek

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2005
1EEG. S. Lujan, W. Magnus, L.-Å. Ragnarsson, S. Kubicek, Stefan De Gendt, Marc M. Heyns, K. De Meyer: Modelling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance. Microelectronics Reliability 45(5-6): 794-797 (2005)

Coauthor Index

1Stefan De Gendt [1]
2Marc M. Heyns [1]
3G. S. Lujan [1]
4W. Magnus [1]
5K. De Meyer [1]
6L.-Å. Ragnarsson [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)