Jiangang Zhu

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2002

1 EE Hongxia Liu, Yue Hao, Jiangang Zhu: A thorough investigation of hot-carrier-induced gate oxide breakdown in partially depleted N- and P-channel SIMOX MOSFETs. Microelectronics Reliability 42(7): 1037-1044 (2002)

2002
1	EE	Hongxia Liu, Yue Hao, Jiangang Zhu: A thorough investigation of hot-carrier-induced gate oxide breakdown in partially depleted N- and P-channel SIMOX MOSFETs. Microelectronics Reliability 42(7): 1037-1044 (2002)

Coauthor Index

1 Yue Hao [1]

2 Hongxia Liu [1]