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Xuchao Duan

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2003
1EETianxu Zhao, Xuchao Duan, Yue Hao, Peijun Ma: Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip. DFT 2003: 11-17

Coauthor Index

1Yue Hao [1]
2Peijun Ma [1]
3Tianxu Zhao [1]

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