Xuchao Duan

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2003

1 EE Tianxu Zhao, Xuchao Duan, Yue Hao, Peijun Ma: Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip. DFT 2003: 11-17

2003
1	EE	Tianxu Zhao, Xuchao Duan, Yue Hao, Peijun Ma: Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip. DFT 2003: 11-17

Coauthor Index

1 Yue Hao [1]

2 Peijun Ma [1]

3 Tianxu Zhao [1]