Jin-feng Zhang
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2005
1
EE
Ming-e Jing
,
Yue Hao
, Jin-feng Zhang,
Peijun Ma
: Efficient parametric yield optimization of VLSI circuit by uniform design sampling method.
Microelectronics Reliability 45
(1): 155-162 (2005)
Coauthor
Index
1
Yue Hao
[
1
]
2
Ming-e Jing
[
1
]
3
Peijun Ma
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
