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Taifeng Chen

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2001
1EETianxu Zhao, Yue Hao, Peijun Ma, Taifeng Chen: Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model. DFT 2001: 48-

Coauthor Index

1Yue Hao [1]
2Peijun Ma [1]
3Tianxu Zhao [1]

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