Taifeng Chen
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2001
1
EE
Tianxu Zhao
,
Yue Hao
,
Peijun Ma
, Taifeng Chen: Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model.
DFT 2001
: 48-
Coauthor
Index
1
Yue Hao
[
1
]
2
Peijun Ma
[
1
]
3
Tianxu Zhao
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)