| |
| 2006 | ||
|---|---|---|
| 1 | EE | J. M. Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire: Time gating imaging through thick silicon substrate: a new step towards backside characterisation. Microelectronics Reliability 46(9-11): 1520-1524 (2006) |
| 1 | Wilfrid Claeys | [1] |
| 2 | Stefan Dilhaire | [1] |
| 3 | Stéphane Grauby | [1] |
| 4 | J. M. Rampnoux | [1] |
| 5 | M. Amine Salhi | [1] |