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| 2004 | ||
|---|---|---|
| 1 | EE | Stefan Dilhaire, Stéphane Grauby, S. Jorez, Wilfrid Claeys: Strain energy imaging of a power MOS transistor using speckle interferometry. IEEE Transactions on Reliability 53(2): 293-296 (2004) |
| 1 | Wilfrid Claeys | [1] |
| 2 | Stefan Dilhaire | [1] |
| 3 | Stéphane Grauby | [1] |