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| 2003 | ||
|---|---|---|
| 1 | EE | J. Kuchenbecker, M. Borgarino, M. Zeuner, U. König, R. Plana, Fausto Fantini: High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's. Microelectronics Reliability 43(9-11): 1719-1723 (2003) |
| 1 | M. Borgarino | [1] |
| 2 | Fausto Fantini | [1] |
| 3 | U. König | [1] |
| 4 | J. Kuchenbecker | [1] |
| 5 | R. Plana | [1] |