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M. Borgarino

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2006
4EEM. Pifferi, M. Borgarino, R. Codeluppi, F. Alimenti: High linearity CMOS mixer for domotic 5GHz WLAN sliding-IF receivers. Microelectronics Journal 37(9): 1012-1017 (2006)
2003
3EEJ. Kuchenbecker, M. Borgarino, M. Zeuner, U. König, R. Plana, Fausto Fantini: High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's. Microelectronics Reliability 43(9-11): 1719-1723 (2003)
2002
2EEV. Lista, P. Garbossa, T. Tomasi, M. Borgarino, Fausto Fantini, L. Gherardi, A. Righetti, M. Villa: Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications. Microelectronics Reliability 42(9-11): 1389-1392 (2002)
2001
1EEM. Borgarino, Roberto Menozzi, D. Dieci, L. Cattani, Fausto Fantini: Reliability physics of compound semiconductor transistors for microwave applications. Microelectronics Reliability 41(1): 21-30 (2001)

Coauthor Index

1F. Alimenti [4]
2L. Cattani [1]
3R. Codeluppi [4]
4D. Dieci [1]
5Fausto Fantini [1] [2] [3]
6P. Garbossa [2]
7L. Gherardi [2]
8U. König [3]
9J. Kuchenbecker [3]
10V. Lista [2]
11Roberto Menozzi [1]
12M. Pifferi [4]
13R. Plana [3]
14A. Righetti [2]
15T. Tomasi [2]
16M. Villa [2]
17M. Zeuner [3]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)