| |
| 2002 | ||
|---|---|---|
| 1 | EE | V. Lista, P. Garbossa, T. Tomasi, M. Borgarino, Fausto Fantini, L. Gherardi, A. Righetti, M. Villa: Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications. Microelectronics Reliability 42(9-11): 1389-1392 (2002) |
| 1 | M. Borgarino | [1] |
| 2 | Fausto Fantini | [1] |
| 3 | L. Gherardi | [1] |
| 4 | V. Lista | [1] |
| 5 | A. Righetti | [1] |
| 6 | T. Tomasi | [1] |
| 7 | M. Villa | [1] |