|  |  | 
| 2003 | ||
|---|---|---|
| 2 | EE | X. Lafontan, F. Pressecq, Felix Beaudoin, S. Rigo, M. Dardalhon, J.-L. Roux, P. Schmitt, J. Kuchenbecker, B. Baradat, D. Lellouchi: The advent of MEMS in space. Microelectronics Reliability 43(7): 1061-1083 (2003) | 
| 1 | EE | J. Kuchenbecker, M. Borgarino, M. Zeuner, U. König, R. Plana, Fausto Fantini: High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's. Microelectronics Reliability 43(9-11): 1719-1723 (2003) | 
| 1 | B. Baradat | [2] | 
| 2 | Felix Beaudoin | [2] | 
| 3 | M. Borgarino | [1] | 
| 4 | M. Dardalhon | [2] | 
| 5 | Fausto Fantini | [1] | 
| 6 | U. König | [1] | 
| 7 | X. Lafontan | [2] | 
| 8 | D. Lellouchi | [2] | 
| 9 | R. Plana | [1] | 
| 10 | F. Pressecq | [2] | 
| 11 | S. Rigo | [2] | 
| 12 | J.-L. Roux | [2] | 
| 13 | P. Schmitt | [2] | 
| 14 | M. Zeuner | [1] |