2003 | ||
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2 | EE | X. Lafontan, F. Pressecq, Felix Beaudoin, S. Rigo, M. Dardalhon, J.-L. Roux, P. Schmitt, J. Kuchenbecker, B. Baradat, D. Lellouchi: The advent of MEMS in space. Microelectronics Reliability 43(7): 1061-1083 (2003) |
1 | EE | J. Kuchenbecker, M. Borgarino, M. Zeuner, U. König, R. Plana, Fausto Fantini: High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's. Microelectronics Reliability 43(9-11): 1719-1723 (2003) |
1 | B. Baradat | [2] |
2 | Felix Beaudoin | [2] |
3 | M. Borgarino | [1] |
4 | M. Dardalhon | [2] |
5 | Fausto Fantini | [1] |
6 | U. König | [1] |
7 | X. Lafontan | [2] |
8 | D. Lellouchi | [2] |
9 | R. Plana | [1] |
10 | F. Pressecq | [2] |
11 | S. Rigo | [2] |
12 | J.-L. Roux | [2] |
13 | P. Schmitt | [2] |
14 | M. Zeuner | [1] |