Dennis J. Ciplickas

2007
2	EE	Alfred L. Crouch, Phil Burlison, Dennis J. Ciplickas: Processing High Volume Scan Test Results for Yield Learning. ISQED 2007: 293-298
1996
1	EE	Dennis J. Ciplickas, Ronald A. Rohrer: Expected current distributions for CMOS circuits. ICCAD 1996: 589-592

Coauthor Index

1	Phil Burlison	[2]
2	Alfred L. Crouch	[2]
3	Ronald A. Rohrer	[1]

Colors in the list of coauthors