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Chris Chan

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2008
1EEMelanie Po-Leen Ooi, Ye Chow Kuang, Chris Chan, Serge N. Demidenko: Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices. DELTA 2008: 216-221

Coauthor Index

1Serge N. Demidenko [1]
2Ye Chow Kuang [1]
3Melanie Po-Leen Ooi [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)