Chris Chan
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2008
1
EE
Melanie Po-Leen Ooi
,
Ye Chow Kuang
, Chris Chan,
Serge N. Demidenko
: Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices.
DELTA 2008
: 216-221
Coauthor
Index
1
Serge N. Demidenko
[
1
]
2
Ye Chow Kuang
[
1
]
3
Melanie Po-Leen Ooi
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)