| |
| 2006 | ||
|---|---|---|
| 2 | EE | Joseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor: Electronic circuit reliability modeling. Microelectronics Reliability 46(12): 1957-1979 (2006) |
| 2005 | ||
| 1 | EE | Xiaojun Li, Bing Huang, J. Qin, X. Zhang, Michael Talmor, Z. Gur, Joseph B. Bernstein: Deep Submicron CMOS Integrated Circuit Reliability Simulation with SPICE. ISQED 2005: 382-389 |
| 1 | Joseph B. Bernstein | [1] [2] |
| 2 | Z. Gur | [1] |
| 3 | Moshe Gurfinkel | [2] |
| 4 | Bing Huang | [1] |
| 5 | Xiaojun Li | [1] [2] |
| 6 | J. Qin | [1] |
| 7 | Yoram Shapira | [2] |
| 8 | Jörg Walters | [2] |
| 9 | X. Zhang | [1] |