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2006 | ||
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2 | EE | Joseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor: Electronic circuit reliability modeling. Microelectronics Reliability 46(12): 1957-1979 (2006) |
2005 | ||
1 | EE | Xiaojun Li, Bing Huang, J. Qin, X. Zhang, Michael Talmor, Z. Gur, Joseph B. Bernstein: Deep Submicron CMOS Integrated Circuit Reliability Simulation with SPICE. ISQED 2005: 382-389 |
1 | Joseph B. Bernstein | [1] [2] |
2 | Z. Gur | [1] |
3 | Moshe Gurfinkel | [2] |
4 | Bing Huang | [1] |
5 | Xiaojun Li | [1] [2] |
6 | J. Qin | [1] |
7 | Yoram Shapira | [2] |
8 | Jörg Walters | [2] |
9 | X. Zhang | [1] |