| |
| 2006 | ||
|---|---|---|
| 1 | EE | Joseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor: Electronic circuit reliability modeling. Microelectronics Reliability 46(12): 1957-1979 (2006) |
| 1 | Joseph B. Bernstein | [1] |
| 2 | Moshe Gurfinkel | [1] |
| 3 | Xiaojun Li | [1] |
| 4 | Yoram Shapira | [1] |
| 5 | Michael Talmor | [1] |