![]() | ![]() |
2006 | ||
---|---|---|
1 | EE | Joseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor: Electronic circuit reliability modeling. Microelectronics Reliability 46(12): 1957-1979 (2006) |
1 | Joseph B. Bernstein | [1] |
2 | Moshe Gurfinkel | [1] |
3 | Xiaojun Li | [1] |
4 | Michael Talmor | [1] |
5 | Jörg Walters | [1] |