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| 2005 | ||
|---|---|---|
| 1 | EE | Xiaojun Li, Bing Huang, J. Qin, X. Zhang, Michael Talmor, Z. Gur, Joseph B. Bernstein: Deep Submicron CMOS Integrated Circuit Reliability Simulation with SPICE. ISQED 2005: 382-389 |
| 1 | Joseph B. Bernstein | [1] |
| 2 | Bing Huang | [1] |
| 3 | Xiaojun Li | [1] |
| 4 | J. Qin | [1] |
| 5 | Michael Talmor | [1] |
| 6 | X. Zhang | [1] |