Joerg D. Walter

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2005

1 EE Xiaojun Li, Joerg D. Walter, Joseph B. Bernstein: Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature. ISQED 2005: 496-502

2005
1	EE	Xiaojun Li, Joerg D. Walter, Joseph B. Bernstein: Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature. ISQED 2005: 496-502

Coauthor Index

1 Joseph B. Bernstein [1]

2 Xiaojun Li [1]