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Moshe Gurfinkel

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2006
1EEJoseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor: Electronic circuit reliability modeling. Microelectronics Reliability 46(12): 1957-1979 (2006)

Coauthor Index

1Joseph B. Bernstein [1]
2Xiaojun Li [1]
3Yoram Shapira [1]
4Michael Talmor [1]
5Jörg Walters [1]

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