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| 2007 | ||
|---|---|---|
| 2 | Nong-Kun Chen, Teng-Hsun Chang, Jiann-Liang Chen, Cheng-Yen Wu, Huan-Wen Tzeng: Reliable ALE Middleware for RFID Network Applications. CSREA EEE 2007: 183-189 | |
| 2006 | ||
| 1 | EE | Jia-Lin Wu, Hua-Ching Chien, Chien-Wei Liao, Cheng-Yen Wu, Chih-Yuan Lee, Houng-Chi Wei, Shih-Hsien Chen, Hann-Ping Hwang, Saysamone Pittikoun, Travis Cho, Chin-Hsing Kao: Comparison of Electrical and Reliability Characteristics of Different Tunnel Oxides in SONOS Flash Memory. MTDT 2006: 80-84 |
| 1 | Teng-Hsun Chang | [2] |
| 2 | Jiann-Liang Chen | [2] |
| 3 | Nong-Kun Chen | [2] |
| 4 | Shih-Hsien Chen | [1] |
| 5 | Hua-Ching Chien | [1] |
| 6 | Travis Cho | [1] |
| 7 | Hann-Ping Hwang | [1] |
| 8 | Chin-Hsing Kao | [1] |
| 9 | Chih-Yuan Lee | [1] |
| 10 | Chien-Wei Liao | [1] |
| 11 | Saysamone Pittikoun | [1] |
| 12 | Huan-Wen Tzeng | [2] |
| 13 | Houng-Chi Wei | [1] |
| 14 | Jia-Lin Wu | [1] |