Houng-Chi Wei

2006
2	EE	Victor Chao-Wei Kuo, Chih-Ming Chao, Chih-Kai Kang, Li-Wei Liu, Tzung-Bin Huang, Liang-Tai Kuo, Shi-Hsien Chen, Houng-Chi Wei, Hann-Ping Hwang, Saysamone Pittikoun: Detailed Comparisons of Program, Erase and Data Retention Characteristics between P+- and N+-Poly SONOS NAND Flash Memory. MTDT 2006: 77-79
1	EE	Jia-Lin Wu, Hua-Ching Chien, Chien-Wei Liao, Cheng-Yen Wu, Chih-Yuan Lee, Houng-Chi Wei, Shih-Hsien Chen, Hann-Ping Hwang, Saysamone Pittikoun, Travis Cho, Chin-Hsing Kao: Comparison of Electrical and Reliability Characteristics of Different Tunnel Oxides in SONOS Flash Memory. MTDT 2006: 80-84

Coauthor Index

1	Chih-Ming Chao	[2]
2	Shi-Hsien Chen	[2]
3	Shih-Hsien Chen	[1]
4	Hua-Ching Chien	[1]
5	Travis Cho	[1]
6	Tzung-Bin Huang	[2]
7	Hann-Ping Hwang	[1] [2]
8	Chih-Kai Kang	[2]
9	Chin-Hsing Kao	[1]
10	Liang-Tai Kuo	[2]
11	Victor Chao-Wei Kuo	[2]
12	Chih-Yuan Lee	[1]
13	Chien-Wei Liao	[1]
14	Li-Wei Liu	[2]
15	Saysamone Pittikoun	[1] [2]
16	Cheng-Yen Wu	[1]
17	Jia-Lin Wu	[1]