2008 | ||
---|---|---|
2 | EE | Yoshiaki Asao, Masayoshi Iwayama, Kenji Tsuchida, Akihiro Nitayama, Hiroaki Yoda, Hisanori Aikawa, Sumio Ikegawa, Tatsuya Kishi: A Statistical Model for Assessing the Fault Tolerance of Variable Switching Currents for a 1Gb Spin Transfer Torque Magnetoresistive Random Access Memory. DFT 2008: 507-515 |
2006 | ||
1 | EE | Yuui Shimizu, Hisanori Aikawa, Keiji Hosotani, Naoharu Shimomura, Tadashi Kai, Yoshihiro Ueda, Yoshiaki Asao, Yoshihisa Iwata, Kenji Tsuchida, Sumio Ikegawa: MRAM Write Error Categorization with QCKB. MTDT 2006: 43-48 |
1 | Hisanori Aikawa | [1] [2] |
2 | Yoshiaki Asao | [1] [2] |
3 | Keiji Hosotani | [1] |
4 | Yoshihisa Iwata | [1] |
5 | Masayoshi Iwayama | [2] |
6 | Tadashi Kai | [1] |
7 | Tatsuya Kishi | [2] |
8 | Akihiro Nitayama | [2] |
9 | Yuui Shimizu | [1] |
10 | Naoharu Shimomura | [1] |
11 | Kenji Tsuchida | [1] [2] |
12 | Yoshihiro Ueda | [1] |
13 | Hiroaki Yoda | [2] |