| |
| 2006 | ||
|---|---|---|
| 1 | EE | Jia-Lin Wu, Hua-Ching Chien, Chien-Wei Liao, Cheng-Yen Wu, Chih-Yuan Lee, Houng-Chi Wei, Shih-Hsien Chen, Hann-Ping Hwang, Saysamone Pittikoun, Travis Cho, Chin-Hsing Kao: Comparison of Electrical and Reliability Characteristics of Different Tunnel Oxides in SONOS Flash Memory. MTDT 2006: 80-84 |
| 1 | Shih-Hsien Chen | [1] |
| 2 | Hua-Ching Chien | [1] |
| 3 | Travis Cho | [1] |
| 4 | Hann-Ping Hwang | [1] |
| 5 | Chin-Hsing Kao | [1] |
| 6 | Chih-Yuan Lee | [1] |
| 7 | Chien-Wei Liao | [1] |
| 8 | Saysamone Pittikoun | [1] |
| 9 | Houng-Chi Wei | [1] |
| 10 | Cheng-Yen Wu | [1] |