| 2005 |
|---|
| 4 | EE | S. Bargstädt-Franke,
Wolfgang Stadler,
K. Esmark,
M. Streibl,
K. Domanski,
Horst A. Gieser,
Heinrich Wolf,
W. Bala:
Transient latch-up: experimental analysis and device simulation.
Microelectronics Reliability 45(2): 297-304 (2005) |
| 3 | EE | M. Streibl,
F. Zängl,
K. Esmark,
Robert Schwencker,
Wolfgang Stadler,
Harald Gossner,
S. Drüen,
Doris Schmitt-Landsiedel:
High abstraction level permutational ESD concept analysis.
Microelectronics Reliability 45(2): 313-321 (2005) |
| 2003 |
|---|
| 2 | EE | M. Streibl,
K. Esmark,
A. Sieck,
Wolfgang Stadler,
M. Wendel,
J. Szatkowski,
Harald Gossner:
Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies.
Microelectronics Reliability 43(7): 1001-1010 (2003) |
| 2002 |
|---|
| 1 | EE | Wolfgang Stadler,
K. Esmark,
Harald Gossner,
M. Streibl,
M. Wendel,
Wolfgang Fichtner,
Dionyz Pogany,
Martin Litzenberger,
E. Gornik:
Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development.
Microelectronics Reliability 42(9-11): 1267-1274 (2002) |
