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M. Streibl

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2005
4EES. Bargstädt-Franke, Wolfgang Stadler, K. Esmark, M. Streibl, K. Domanski, Horst A. Gieser, Heinrich Wolf, W. Bala: Transient latch-up: experimental analysis and device simulation. Microelectronics Reliability 45(2): 297-304 (2005)
3EEM. Streibl, F. Zängl, K. Esmark, Robert Schwencker, Wolfgang Stadler, Harald Gossner, S. Drüen, Doris Schmitt-Landsiedel: High abstraction level permutational ESD concept analysis. Microelectronics Reliability 45(2): 313-321 (2005)
2003
2EEM. Streibl, K. Esmark, A. Sieck, Wolfgang Stadler, M. Wendel, J. Szatkowski, Harald Gossner: Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies. Microelectronics Reliability 43(7): 1001-1010 (2003)
2002
1EEWolfgang Stadler, K. Esmark, Harald Gossner, M. Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, E. Gornik: Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development. Microelectronics Reliability 42(9-11): 1267-1274 (2002)

Coauthor Index

1W. Bala [4]
2S. Bargstädt-Franke [4]
3K. Domanski [4]
4S. Drüen [3]
5K. Esmark [1] [2] [3] [4]
6Wolfgang Fichtner [1]
7Horst A. Gieser [4]
8E. Gornik [1]
9Harald Gossner [1] [2] [3]
10Martin Litzenberger [1]
11Dionyz Pogany [1]
12Doris Schmitt-Landsiedel [3]
13Robert Schwencker [3]
14A. Sieck [2]
15Wolfgang Stadler [1] [2] [3] [4]
16J. Szatkowski [2]
17M. Wendel [1] [2]
18Heinrich Wolf [4]
19F. Zängl [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)