| |
| 2003 | ||
|---|---|---|
| 1 | EE | M. Streibl, K. Esmark, A. Sieck, Wolfgang Stadler, M. Wendel, J. Szatkowski, Harald Gossner: Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies. Microelectronics Reliability 43(7): 1001-1010 (2003) |
| 1 | K. Esmark | [1] |
| 2 | Harald Gossner | [1] |
| 3 | A. Sieck | [1] |
| 4 | Wolfgang Stadler | [1] |
| 5 | M. Streibl | [1] |
| 6 | M. Wendel | [1] |