| 2003 |
|---|
| 3 | EE | M. Streibl,
K. Esmark,
A. Sieck,
Wolfgang Stadler,
M. Wendel,
J. Szatkowski,
Harald Gossner:
Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies.
Microelectronics Reliability 43(7): 1001-1010 (2003) |
| 2002 |
|---|
| 2 | EE | Wolfgang Stadler,
K. Esmark,
Harald Gossner,
M. Streibl,
M. Wendel,
Wolfgang Fichtner,
Dionyz Pogany,
Martin Litzenberger,
E. Gornik:
Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development.
Microelectronics Reliability 42(9-11): 1267-1274 (2002) |
| 2001 |
|---|
| 1 | EE | K. Esmark,
Wolfgang Stadler,
M. Wendel,
Harald Gossner,
X. Guggenmos,
Wolfgang Fichtner:
Advanced 2D/3D ESD device simulation - a powerful tool already used in a pre-Si phase.
Microelectronics Reliability 41(11): 1761-1770 (2001) |
