| |
| 2005 | ||
|---|---|---|
| 2 | EE | M. Streibl, F. Zängl, K. Esmark, Robert Schwencker, Wolfgang Stadler, Harald Gossner, S. Drüen, Doris Schmitt-Landsiedel: High abstraction level permutational ESD concept analysis. Microelectronics Reliability 45(2): 313-321 (2005) |
| 2002 | ||
| 1 | EE | F. Zängl, Harald Gossner, K. Esmark, R. Owen, G. Zimmermann: Case study of a technology transfer causing ESD problems. Microelectronics Reliability 42(9-11): 1275-1280 (2002) |
| 1 | S. Drüen | [2] |
| 2 | K. Esmark | [1] [2] |
| 3 | Harald Gossner | [1] [2] |
| 4 | R. Owen | [1] |
| 5 | Doris Schmitt-Landsiedel | [2] |
| 6 | Robert Schwencker | [2] |
| 7 | Wolfgang Stadler | [2] |
| 8 | M. Streibl | [2] |
| 9 | G. Zimmermann | [1] |