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F. Zängl

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2005
2EEM. Streibl, F. Zängl, K. Esmark, Robert Schwencker, Wolfgang Stadler, Harald Gossner, S. Drüen, Doris Schmitt-Landsiedel: High abstraction level permutational ESD concept analysis. Microelectronics Reliability 45(2): 313-321 (2005)
2002
1EEF. Zängl, Harald Gossner, K. Esmark, R. Owen, G. Zimmermann: Case study of a technology transfer causing ESD problems. Microelectronics Reliability 42(9-11): 1275-1280 (2002)

Coauthor Index

1S. Drüen [2]
2K. Esmark [1] [2]
3Harald Gossner [1] [2]
4R. Owen [1]
5Doris Schmitt-Landsiedel [2]
6Robert Schwencker [2]
7Wolfgang Stadler [2]
8M. Streibl [2]
9G. Zimmermann [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)