| 2008 |
| 15 | EE | Marcin J. Beresinski,
Tomasz Borejko,
Witold A. Pleskacz,
Viera Stopjaková:
Built-In Current Monitor for IDDQ Testing in CMOS 90 nm Technology.
DDECS 2008: 259-262 |
| 14 | EE | Libor Majer,
Viera Stopjaková:
Portable Measurement Equipment for Continuous Biomedical Monitoring using Microelectrodes.
DDECS 2008: 26-29 |
| 13 | EE | Juraj Brenkus,
Viera Stopjaková,
Jozef Mihálov:
Experimental Analog Circuit for Parametric Test Methods Efficiency Evaluation.
DDECS 2008: 293-298 |
| 12 | EE | Martin Donoval,
Martin Daricek,
Viera Stopjaková,
Juraj Marek:
On-chip Integration of Magnetic Force Sensing Current Monitors.
DDECS 2008: 310-313 |
| 11 | EE | Martin Simlastík,
Viera Stopjaková:
Automated Synchronous-to-Asynchronous Circuits Conversion: A Survey.
PATMOS 2008: 348-358 |
| 2007 |
| 10 | | Martin Simlastík,
Viera Stopjaková,
Libor Majer,
Peter Malík:
Clockless Implementation of LEON2 for Low-Power Applications.
DDECS 2007: 215-218 |
| 2006 |
| 9 | | P. Malosek,
Viera Stopjaková:
PCA Data Preprocessing for Neural Network-based Detection of Parametric Defects in Analog IC.
DDECS 2006: 131-135 |
| 8 | | Vladislav Nagy,
Viera Stopjaková:
New Current Monitor Using Auto Zero Voltage Comparator for IDD Testing of Mixed-signal Circuits.
DDECS 2006: 236-237 |
| 2005 |
| 7 | EE | Viera Stopjaková,
P. Malosek,
M. Matej,
Vladislav Nagy,
Martin Margala:
Defect detection in analog and mixed circuits by neural networks using wavelet analysis.
IEEE Transactions on Reliability 54(3): 441-448 (2005) |
| 2004 |
| 6 | EE | Viera Stopjaková,
P. Malosek,
D. Micusík,
M. Matej,
Martin Margala:
Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks.
J. Electronic Testing 20(1): 25-37 (2004) |
| 2002 |
| 5 | EE | Viera Stopjaková,
D. Micusík,
Lubica Benusková,
Martin Margala:
Neural Networks-Based Parametric Testing of Analog IC.
DFT 2002: 408-418 |
| 4 | EE | D. Micusík,
Viera Stopjaková,
Lubica Benusková:
Application of Feed-forward Artificial Neural Networks to the Identification of Defective Analog Integrated Circuits.
Neural Computing and Applications 11(1): 71-79 (2002) |
| 2000 |
| 3 | EE | Martin Margala,
Srdjan Dragic,
Ahmed El-Abasiry,
Samuel Ekpe,
Viera Stopjaková:
I-V Fast IDDQ Current Sensor for On-Line Mixed-Signal/Analog Test.
IOLTW 2000: 92-93 |
| 1999 |
| 2 | EE | Viera Stopjaková,
Hans A. R. Manhaeve,
M. Sidiropulos:
On-Chip Transient Current Monitor for Testing of Low Voltage CMOS IC.
DATE 1999: 538-542 |
| 1997 |
| 1 | EE | Viera Stopjaková,
Hans A. R. Manhaeve:
CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits.
ED&TC 1997: 266-270 |