dblp.uni-trier.dewww.uni-trier.de

Viera Stopjaková

List of publications from the DBLP Bibliography Server - FAQ
Coauthor Index - Ask others: ACM DL/Guide - CiteSeer - CSB - Google - MSN - Yahoo

2008
15EEMarcin J. Beresinski, Tomasz Borejko, Witold A. Pleskacz, Viera Stopjaková: Built-In Current Monitor for IDDQ Testing in CMOS 90 nm Technology. DDECS 2008: 259-262
14EELibor Majer, Viera Stopjaková: Portable Measurement Equipment for Continuous Biomedical Monitoring using Microelectrodes. DDECS 2008: 26-29
13EEJuraj Brenkus, Viera Stopjaková, Jozef Mihálov: Experimental Analog Circuit for Parametric Test Methods Efficiency Evaluation. DDECS 2008: 293-298
12EEMartin Donoval, Martin Daricek, Viera Stopjaková, Juraj Marek: On-chip Integration of Magnetic Force Sensing Current Monitors. DDECS 2008: 310-313
11EEMartin Simlastík, Viera Stopjaková: Automated Synchronous-to-Asynchronous Circuits Conversion: A Survey. PATMOS 2008: 348-358
2007
10 Martin Simlastík, Viera Stopjaková, Libor Majer, Peter Malík: Clockless Implementation of LEON2 for Low-Power Applications. DDECS 2007: 215-218
2006
9 P. Malosek, Viera Stopjaková: PCA Data Preprocessing for Neural Network-based Detection of Parametric Defects in Analog IC. DDECS 2006: 131-135
8 Vladislav Nagy, Viera Stopjaková: New Current Monitor Using Auto Zero Voltage Comparator for IDD Testing of Mixed-signal Circuits. DDECS 2006: 236-237
2005
7EEViera Stopjaková, P. Malosek, M. Matej, Vladislav Nagy, Martin Margala: Defect detection in analog and mixed circuits by neural networks using wavelet analysis. IEEE Transactions on Reliability 54(3): 441-448 (2005)
2004
6EEViera Stopjaková, P. Malosek, D. Micusík, M. Matej, Martin Margala: Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks. J. Electronic Testing 20(1): 25-37 (2004)
2002
5EEViera Stopjaková, D. Micusík, Lubica Benusková, Martin Margala: Neural Networks-Based Parametric Testing of Analog IC. DFT 2002: 408-418
4EED. Micusík, Viera Stopjaková, Lubica Benusková: Application of Feed-forward Artificial Neural Networks to the Identification of Defective Analog Integrated Circuits. Neural Computing and Applications 11(1): 71-79 (2002)
2000
3EEMartin Margala, Srdjan Dragic, Ahmed El-Abasiry, Samuel Ekpe, Viera Stopjaková: I-V Fast IDDQ Current Sensor for On-Line Mixed-Signal/Analog Test. IOLTW 2000: 92-93
1999
2EEViera Stopjaková, Hans A. R. Manhaeve, M. Sidiropulos: On-Chip Transient Current Monitor for Testing of Low Voltage CMOS IC. DATE 1999: 538-542
1997
1EEViera Stopjaková, Hans A. R. Manhaeve: CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits. ED&TC 1997: 266-270

Coauthor Index

1Lubica Benusková [4] [5]
2Marcin J. Beresinski [15]
3Tomasz Borejko [15]
4Juraj Brenkus [13]
5Martin Daricek [12]
6Martin Donoval [12]
7Srdjan Dragic [3]
8Samuel Ekpe [3]
9Ahmed El-Abasiry [3]
10Libor Majer [10] [14]
11Peter Malík [10]
12P. Malosek [6] [7] [9]
13Hans A. R. Manhaeve [1] [2]
14Juraj Marek [12]
15Martin Margala [3] [5] [6] [7]
16M. Matej [6] [7]
17D. Micusík [4] [5] [6]
18Jozef Mihálov [13]
19Vladislav Nagy [7] [8]
20Witold A. Pleskacz [15]
21M. Sidiropulos [2]
22Martin Simlastík [10] [11]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)