| |
| 2008 | ||
|---|---|---|
| 3 | EE | Marcin J. Beresinski, Tomasz Borejko, Witold A. Pleskacz, Viera Stopjaková: Built-In Current Monitor for IDDQ Testing in CMOS 90 nm Technology. DDECS 2008: 259-262 |
| 2 | EE | Tomasz Borejko, Witold A. Pleskacz: A Resistorless Voltage Reference Source for 90 nm CMOS Technology with Low Sensitivity to Process and Temperature Variations. DDECS 2008: 38-43 |
| 2002 | ||
| 1 | EE | Witold A. Pleskacz, Tomasz Borejko, Wieslaw Kuzmicz: CMOS Standard Cells Characterization for IDDQ Testing. DFT 2002: 390-398 |
| 1 | Marcin J. Beresinski | [3] |
| 2 | Wieslaw Kuzmicz | [1] |
| 3 | Witold A. Pleskacz | [1] [2] [3] |
| 4 | Viera Stopjaková | [3] |