| 2008 |
|---|
| 12 | EE | B. Straka,
Hans A. R. Manhaeve,
J. Brenkus,
Stefaan Kerckenaere:
Theoretical and Practical Aspects of IDDQ Settling-Impact on Measurement Timing and Quality.
DATE 2008: 1310-1315 |
| 11 | EE | Hans A. R. Manhaeve:
The Quest for Test: Will Redundancy Cover All?
DDECS 2008: 3 |
| 2005 |
|---|
| 10 | EE | Hans A. R. Manhaeve:
Current Testing for Nanotechnologies: A Demystifying Application Perspective..
Asian Test Symposium 2005: 456 |
| 2004 |
|---|
| 9 | | Hans A. R. Manhaeve:
Current testing for nanotechnologies: Myths, facts, and figures.
IEEE Design & Test of Computers 21(3): 264- (2004) |
| 2001 |
|---|
| 8 | EE | Hans A. R. Manhaeve,
Stefaan Kerckenaere:
An On-Chip Detection Circuit for the Verification of IC Supply Connections.
DFT 2001: 57-65 |
| 2000 |
|---|
| 7 | EE | Hans A. R. Manhaeve,
Johan Verfaillie,
B. Straka,
J. P. Cornil:
Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test Methodology.
J. Electronic Testing 16(3): 227-234 (2000) |
| 1999 |
|---|
| 6 | EE | Viera Stopjaková,
Hans A. R. Manhaeve,
M. Sidiropulos:
On-Chip Transient Current Monitor for Testing of Low Voltage CMOS IC.
DATE 1999: 538-542 |
| 1998 |
|---|
| 5 | EE | B. Straka,
Hans A. R. Manhaeve,
Jozef Vanneuville,
M. Svajda:
A Fully Digital Controlled Off-Chip IDDQ Measurement Unit.
DATE 1998: 495-500 |
| 4 | EE | M. Svajda,
B. Straka,
Hans A. R. Manhaeve:
IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit.
DATE 1998: 959-960 |
| 1997 |
|---|
| 3 | EE | Viera Stopjaková,
Hans A. R. Manhaeve:
CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits.
ED&TC 1997: 266-270 |
| 2 | EE | M. Svajda,
B. Straka,
Hans A. R. Manhaeve:
A monolithic off-chip IDDQ monitor.
ED&TC 1997: 629 |
| 1994 |
|---|
| 1 | | Hans A. R. Manhaeve,
Paul L. Wrighton,
Jos van Sas,
Urbain Swerts:
An Off-chip IDDQ Current Measurement Unit for Telecommunication ASICs.
ITC 1994: 203-212 |
