| 2008 |
|---|
| 8 | EE | Joonsung Park,
Hongjoong Shin,
Jacob A. Abraham:
Parallel Loopback Test of Mixed-Signal Circuits.
VTS 2008: 309-316 |
| 2007 |
|---|
| 7 | EE | Joonsung Park,
Hongjoong Shin,
Jacob A. Abraham:
Pseudorandom Test for Nonlinear Circuits Based on a Simplified Volterra Series Model.
ISQED 2007: 495-500 |
| 2006 |
|---|
| 6 | EE | Minsik Cho,
Hongjoong Shin,
David Z. Pan:
Fast substrate noise-aware floorplanning with preference directed graph for mixed-signal SOCs.
ASP-DAC 2006: 765-770 |
| 5 | EE | Byoungho Kim,
Hongjoong Shin,
Ji Hwan (Paul) Chun,
Jacob A. Abraham:
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters.
European Test Symposium 2006: 199-204 |
| 4 | EE | Hongjoong Shin,
Byoungho Kim,
Jacob A. Abraham:
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits.
VTS 2006: 412-419 |
| 2004 |
|---|
| 3 | EE | Hongjoong Shin,
Hak-soo Yu,
Jacob A. Abraham:
LFSR-based BIST for analog circuits using slope detection.
ACM Great Lakes Symposium on VLSI 2004: 316-321 |
| 2 | EE | Hak-soo Yu,
Hongjoong Shin,
Ji Hwan (Paul) Chun,
Jacob A. Abraham:
Performance Characterization of Mixed-Signal Circuits Using a Ternary Signal Representation.
ITC 2004: 1389-1397 |
| 1 | EE | Ashwin Raghunathan,
Hongjoong Shin,
Jacob A. Abraham,
Abhijit Chatterjee:
Prediction of Analog Performance Parameters Using Oscillation Based Test.
VTS 2004: 377-382 |
