| 2006 |
|---|
| 4 | EE | Byoungho Kim,
Hongjoong Shin,
Ji Hwan (Paul) Chun,
Jacob A. Abraham:
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters.
European Test Symposium 2006: 199-204 |
| 2004 |
|---|
| 3 | EE | Ji Hwan (Paul) Chun,
Hak-soo Yu,
Jacob A. Abraham:
An efficient linearity test for on-chip high speed ADC and DAC using loop-back.
ACM Great Lakes Symposium on VLSI 2004: 328-331 |
| 2 | EE | Hak-soo Yu,
Hongjoong Shin,
Ji Hwan (Paul) Chun,
Jacob A. Abraham:
Performance Characterization of Mixed-Signal Circuits Using a Ternary Signal Representation.
ITC 2004: 1389-1397 |
| 1 | EE | Ashwin Raghunathan,
Ji Hwan (Paul) Chun,
Jacob A. Abraham,
Abhijit Chatterjee:
Quasi-Oscillation Based Test for Improved Prediction of Analog Performance Parameters.
ITC 2004: 252-261 |
