| |
| 2004 | ||
|---|---|---|
| 3 | EE | Ramyanshu Datta, Antony Sebastine, Ashwin Raghunathan, Jacob A. Abraham: On-chip delay measurement for silicon debug. ACM Great Lakes Symposium on VLSI 2004: 145-148 |
| 2 | EE | Ashwin Raghunathan, Ji Hwan (Paul) Chun, Jacob A. Abraham, Abhijit Chatterjee: Quasi-Oscillation Based Test for Improved Prediction of Analog Performance Parameters. ITC 2004: 252-261 |
| 1 | EE | Ashwin Raghunathan, Hongjoong Shin, Jacob A. Abraham, Abhijit Chatterjee: Prediction of Analog Performance Parameters Using Oscillation Based Test. VTS 2004: 377-382 |
| 1 | Jacob A. Abraham | [1] [2] [3] |
| 2 | Abhijit Chatterjee | [1] [2] |
| 3 | Ji Hwan (Paul) Chun | [2] |
| 4 | Ramyanshu Datta | [3] |
| 5 | Antony Sebastine | [3] |
| 6 | Hongjoong Shin | [1] |