| |
| 2008 | ||
|---|---|---|
| 4 | EE | Byoungho Kim, Nash Khouzam, Jacob A. Abraham: Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. VTS 2008: 293-298 |
| 2007 | ||
| 3 | EE | Byoungho Kim, Zhenhai Fu, Jacob A. Abraham: Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications. VTS 2007: 291-296 |
| 2006 | ||
| 2 | EE | Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham: Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters. European Test Symposium 2006: 199-204 |
| 1 | EE | Hongjoong Shin, Byoungho Kim, Jacob A. Abraham: Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. VTS 2006: 412-419 |
| 1 | Jacob A. Abraham | [1] [2] [3] [4] |
| 2 | Ji Hwan (Paul) Chun | [2] |
| 3 | Zhenhai Fu | [3] |
| 4 | Nash Khouzam | [4] |
| 5 | Hongjoong Shin | [1] [2] |