| |
| 2005 | ||
|---|---|---|
| 1 | EE | W. Deweerd, V. Kaushik, J. Chen, Y. Shimamoto, T. Schram, L.-Å. Ragnarsson, A. Delabie, L. Pantisano, B. Eyckens, J. W. Maes: Potential remedies for the VT/Vfb-shift problem of Hf/polysilicon-based gate stacks: a solution-based survey. Microelectronics Reliability 45(5-6): 786-789 (2005) |
| 1 | J. Chen | [1] |
| 2 | A. Delabie | [1] |
| 3 | W. Deweerd | [1] |
| 4 | B. Eyckens | [1] |
| 5 | J. W. Maes | [1] |
| 6 | L. Pantisano | [1] |
| 7 | L.-Å. Ragnarsson | [1] |
| 8 | T. Schram | [1] |
| 9 | Y. Shimamoto | [1] |