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V. Kaushik

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2005
1EEW. Deweerd, V. Kaushik, J. Chen, Y. Shimamoto, T. Schram, L.-Å. Ragnarsson, A. Delabie, L. Pantisano, B. Eyckens, J. W. Maes: Potential remedies for the VT/Vfb-shift problem of Hf/polysilicon-based gate stacks: a solution-based survey. Microelectronics Reliability 45(5-6): 786-789 (2005)

Coauthor Index

1J. Chen [1]
2A. Delabie [1]
3W. Deweerd [1]
4B. Eyckens [1]
5J. W. Maes [1]
6L. Pantisano [1]
7L.-Å. Ragnarsson [1]
8T. Schram [1]
9Y. Shimamoto [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)