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| 2 | EE | W. Deweerd, V. Kaushik, J. Chen, Y. Shimamoto, T. Schram, L.-Å. Ragnarsson, A. Delabie, L. Pantisano, B. Eyckens, J. W. Maes: Potential remedies for the VT/Vfb-shift problem of Hf/polysilicon-based gate stacks: a solution-based survey. Microelectronics Reliability 45(5-6): 786-789 (2005) |
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| 1 | J. Chen | [2] |
| 2 | A. Delabie | [2] |
| 3 | W. Deweerd | [2] |
| 4 | B. Eyckens | [2] |
| 5 | V. Kaushik | [2] |
| 6 | J. W. Maes | [2] |
| 7 | L. Pantisano | [2] |
| 8 | L.-Å. Ragnarsson | [2] |
| 9 | T. Schram | [2] |