T. Schram

2005
2	EE	T. Schram, L.-Å. Ragnarsson, G. Lujan, W. Deweerd, J. Chen, W. Tsai, K. Henson, R. J. P. Lander, J. C. Hooker, J. Vertommen: Performance improvement of self-aligned HfO2/TaN and SiON/TaN nMOS transistors. Microelectronics Reliability 45(5-6): 779-782 (2005)
1	EE	W. Deweerd, V. Kaushik, J. Chen, Y. Shimamoto, T. Schram, L.-Å. Ragnarsson, A. Delabie, L. Pantisano, B. Eyckens, J. W. Maes: Potential remedies for the VT/Vfb-shift problem of Hf/polysilicon-based gate stacks: a solution-based survey. Microelectronics Reliability 45(5-6): 786-789 (2005)

Coauthor Index

1	J. Chen	[1] [2]
2	A. Delabie	[1]
3	W. Deweerd	[1] [2]
4	B. Eyckens	[1]
5	K. Henson	[2]
6	J. C. Hooker	[2]
7	V. Kaushik	[1]
8	R. J. P. Lander	[2]
9	G. Lujan	[2]
10	J. W. Maes	[1]
11	L. Pantisano	[1]
12	L.-Å. Ragnarsson	[1] [2]
13	Y. Shimamoto	[1]
14	W. Tsai	[2]
15	J. Vertommen	[2]