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W. Deweerd

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2005
2EET. Schram, L.-Å. Ragnarsson, G. Lujan, W. Deweerd, J. Chen, W. Tsai, K. Henson, R. J. P. Lander, J. C. Hooker, J. Vertommen: Performance improvement of self-aligned HfO2/TaN and SiON/TaN nMOS transistors. Microelectronics Reliability 45(5-6): 779-782 (2005)
1EEW. Deweerd, V. Kaushik, J. Chen, Y. Shimamoto, T. Schram, L.-Å. Ragnarsson, A. Delabie, L. Pantisano, B. Eyckens, J. W. Maes: Potential remedies for the VT/Vfb-shift problem of Hf/polysilicon-based gate stacks: a solution-based survey. Microelectronics Reliability 45(5-6): 786-789 (2005)

Coauthor Index

1J. Chen [1] [2]
2A. Delabie [1]
3B. Eyckens [1]
4K. Henson [2]
5J. C. Hooker [2]
6V. Kaushik [1]
7R. J. P. Lander [2]
8G. Lujan [2]
9J. W. Maes [1]
10L. Pantisano [1]
11L.-Å. Ragnarsson [1] [2]
12T. Schram [1] [2]
13Y. Shimamoto [1]
14W. Tsai [2]
15J. Vertommen [2]

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