L. Pantisano

2005
2	EE	W. Deweerd, V. Kaushik, J. Chen, Y. Shimamoto, T. Schram, L.-Å. Ragnarsson, A. Delabie, L. Pantisano, B. Eyckens, J. W. Maes: Potential remedies for the VT/Vfb-shift problem of Hf/polysilicon-based gate stacks: a solution-based survey. Microelectronics Reliability 45(5-6): 786-789 (2005)
1	EE	J. Pétry, Wilfried Vandervorst, L. Pantisano, Robin Degraeve: On the data interpretation of the C-AFM measurements in the characterization of thin insulating layers. Microelectronics Reliability 45(5-6): 815-818 (2005)

Coauthor Index

1	J. Chen	[2]
2	Robin Degraeve	[1]
3	A. Delabie	[2]
4	W. Deweerd	[2]
5	B. Eyckens	[2]
6	V. Kaushik	[2]
7	J. W. Maes	[2]
8	J. Pétry	[1]
9	L.-Å. Ragnarsson	[2]
10	T. Schram	[2]
11	Y. Shimamoto	[2]
12	Wilfried Vandervorst	[1]

Colors in the list of coauthors