J. W. Maes

2005
1	EE	W. Deweerd, V. Kaushik, J. Chen, Y. Shimamoto, T. Schram, L.-Å. Ragnarsson, A. Delabie, L. Pantisano, B. Eyckens, J. W. Maes: Potential remedies for the VT/Vfb-shift problem of Hf/polysilicon-based gate stacks: a solution-based survey. Microelectronics Reliability 45(5-6): 786-789 (2005)

Coauthor Index

1	J. Chen	[1]
2	A. Delabie	[1]
3	W. Deweerd	[1]
4	B. Eyckens	[1]
5	V. Kaushik	[1]
6	L. Pantisano	[1]
7	L.-Å. Ragnarsson	[1]
8	T. Schram	[1]
9	Y. Shimamoto	[1]