| |
| 2005 | ||
|---|---|---|
| 1 | EE | Maria Da Gloria Flores, Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin, Felipe R. Clayton, Cristiano Benevento: Low Cost BIST for Static and Dynamic Testing of ADCs. J. Electronic Testing 21(3): 283-290 (2005) |
| 1 | Luigi Carro | [1] |
| 2 | Felipe R. Clayton | [1] |
| 3 | Maria Da Gloria Flores | [1] |
| 4 | Marcelo Negreiros | [1] |
| 5 | Altamiro Amadeu Susin | [1] |