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C. Monserie

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2005
1EED. Goguenheim, A. Bravaix, S. Gomri, J. M. Moragues, C. Monserie, N. Legrand, P. Boivin: Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies. Microelectronics Reliability 45(3-4): 487-492 (2005)

Coauthor Index

1P. Boivin [1]
2A. Bravaix [1]
3D. Goguenheim [1]
4S. Gomri [1]
5N. Legrand [1]
6J. M. Moragues [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)