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| 2005 | ||
|---|---|---|
| 1 | EE | D. Goguenheim, A. Bravaix, S. Gomri, J. M. Moragues, C. Monserie, N. Legrand, P. Boivin: Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies. Microelectronics Reliability 45(3-4): 487-492 (2005) |
| 1 | P. Boivin | [1] |
| 2 | A. Bravaix | [1] |
| 3 | D. Goguenheim | [1] |
| 4 | N. Legrand | [1] |
| 5 | C. Monserie | [1] |
| 6 | J. M. Moragues | [1] |