| |
| 2005 | ||
|---|---|---|
| 2 | EE | D. Goguenheim, A. Bravaix, S. Gomri, J. M. Moragues, C. Monserie, N. Legrand, P. Boivin: Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies. Microelectronics Reliability 45(3-4): 487-492 (2005) |
| 1 | EE | N. Baboux, C. Plossu, P. Boivin: Dynamic Fowler-Nordheim injection in EEPROM tunnel oxides at realistic time scales. Microelectronics Reliability 45(5-6): 911-914 (2005) |
| 1 | N. Baboux | [1] |
| 2 | A. Bravaix | [2] |
| 3 | D. Goguenheim | [2] |
| 4 | S. Gomri | [2] |
| 5 | N. Legrand | [2] |
| 6 | C. Monserie | [2] |
| 7 | J. M. Moragues | [2] |
| 8 | C. Plossu | [1] |